📏 Surface roughness measurement (Ra, Rz)

Automotive PN-EN ISO 4287

In short

Terms, definitions and parameters of surface texture determined by the profile method — primary profile, roughness and waviness profiles and parameters such as Ra and Rz; ISO 4287:1997 has been withdrawn and replaced by ISO 21920-2:2021, and the assessment rules of ISO 4288 by ISO 21920-3:2021. The test is performed according to PN-EN ISO 4287:1999; Ra: arithmetic mean of the absolute ordinate values of the roughness profile within a sampling length (ISO 4287; Mitutoyo guide). The procedure comprises 6 steps; it is used for: Specifying and reading requirements for roughness, waviness and primary profile on drawings and in product specifications — terms and parameters of the profile method (ISO 4287, clause 1), Assessment of roughness after machining and comparison with the drawing tolerance — according to the rules of ISO 4288, now ISO 21920-3, Transition of documentation and instrument software from ISO 4287 to ISO 21920-2 (change in the definition of field parameters).

At a glance

  • Standard: PN-EN ISO 4287:1999
  • Category: Automotive
  • Procedure steps: 6
  • Ra: arithmetic mean of the absolute ordinate values of the roughness profile within a sampling length (ISO 4287; Mitutoyo guide)
  • Rz: sum of the largest profile peak height and the largest profile valley depth within a sampling length (ISO 4287; Mitutoyo guide)
  • Other parameters: Rq, Rp, Rv, Rt (within the evaluation length), RSm, as well as primary profile (P) and waviness (W) parameters

Overview

STATUS (as of 06.11.2026). PN-EN ISO 4287:1999 — Polish version, published on 16.11.1999, which implemented EN ISO 4287:1998 and ISO 4287:1997 [IDT] — was WITHDRAWN on 21.06.2022 and replaced by PN-EN ISO 21920-2:2022-06 (English version). ISO 4287:1997 was withdrawn and ISO 21920-2:2021 was published on 20.12.2021; on the same day ISO 4288:1996 was withdrawn and replaced by ISO 21920-3:2021. The description below gives the content of ISO 4287 from the available text and the changes introduced by ISO 21920-2. Laboratories still cite PN-EN ISO 4287 in their scopes of accreditation — citing a withdrawn standard requires a deliberate decision agreed with the customer.

WHAT THIS STANDARD IS (ISO 4287:1997, clauses 1–2). The standard specifies terms, definitions and parameters for the determination of surface texture — roughness, waviness and primary profile — by profiling methods. It does not describe an instrument or a measurement procedure: the nominal characteristics of contact (stylus) instruments were given in ISO 3274:1996, the rules and procedures for the assessment of surface texture in ISO 4288:1996, and phase-correct filters in ISO 11562:1996 (normative references).

PROFILES AND FILTERS (clause 3). The surface profile is the intersection of the real surface with a specified plane. The primary profile (according to ISO 3274) is the basis for the primary profile parameters. The roughness profile is derived from the primary profile by suppressing the long-wave components with the λc filter; the λs filter separates roughness from even shorter components, and the λf filter defines the boundary between waviness and longer waves. The waviness profile is obtained by applying the λf and λc filters in turn. All three filters have the same transmission characteristic according to ISO 11562 but different cut-off wavelengths; the default relationship between λc and λs is given in ISO 3274.

PARAMETERS (second source — measuring instrument manufacturer guide, Mitutoyo 2021, according to ISO 4287:1997 with Amd 1:2009). Ra — arithmetic mean of the absolute ordinate values of the roughness profile within a sampling length; Rq — root mean square of the ordinates; Rp — largest profile peak height, Rv — largest profile valley depth, and Rz — the sum of these two, all within a sampling length; Rt — the same sum within the evaluation length; RSm — mean width of the profile elements within a sampling length. The same guide gives, after the instrument standards, stylus tip radii of 2 µm, 5 µm or 10 µm and a table of cut-off wavelengths λc (0.08; 0.25; 0.8; 2.5; 8 mm) with the corresponding λs (2.5; 2.5; 2.5; 8; 25 µm) and maximum tip radius (2; 2; 2; 5; 10 µm).

WHAT ISO 21920-2:2021 CHANGED. The first edition of ISO 21920-2 cancelled and replaced ISO 4287:1997 (with Amd 1:2009 and corrigenda) and ISO 13565-2 and 13565-3. The main changes compared with ISO 4287: all field parameters now relate to the evaluation length, profile elements are evaluated unambiguously, and new parameters were defined, in particular those based on the watershed transformation (details — Annex I of the standard, outside the available text). In text, parameters are written as abbreviated terms with lower-case suffixes, e.g. Rq.

WHAT WE DO NOT GIVE HERE. The parameter definitions of clause 4 of ISO 4287 and the new definitions of ISO 21920-2 — the available parts of both standards end with the general terms, and we give the definitions of Ra and Rz after the manufacturer guide. Rules for choosing the lengths, the number of sampling lengths and the rules for comparison with a tolerance (ISO 4288, now ISO 21920-3) — we did not have these texts. Typical Ra values for machining methods and conversions between Ra and Rz — the standard does not give them.

Method principle

The stylus of a contact instrument traverses the surface along a specified line, and the recorded primary profile is filtered: the λs filter removes the shortest waves and the λc filter separates roughness from waviness. Parameters are determined from the roughness profile, for example Ra (arithmetic mean of the absolute ordinates) and Rz (sum of the highest peak and the deepest valley within a sampling length according to ISO 4287). According to ISO 21920-2:2021, which replaced ISO 4287, field parameters relate to the evaluation length.

Applications

Key parameters

ParameterValue
Raarithmetic mean of the absolute ordinate values of the roughness profile within a sampling length (ISO 4287; Mitutoyo guide)
Rzsum of the largest profile peak height and the largest profile valley depth within a sampling length (ISO 4287; Mitutoyo guide)
Other parametersRq, Rp, Rv, Rt (within the evaluation length), RSm, as well as primary profile (P) and waviness (W) parameters
Profile filtersλs, λc, λf — characteristic according to ISO 11562, different cut-off wavelengths (3.1.1)
Cut-off wavelengths λc (Mitutoyo guide)0.08; 0.25; 0.8; 2.5; 8 mm, with λs 2.5; 2.5; 2.5; 8; 25 µm
Stylus tip radius (Mitutoyo guide)2 µm, 5 µm or 10 µm
Change in ISO 21920-2:2021field parameters related to the evaluation length; new parameters (foreword)

Standard

Standard number
PN-EN ISO 4287:1999
Title (PL)
Specyfikacje geometrii wyrobów — Struktura geometryczna powierzchni: metoda profilowa — Terminy, definicje i parametry struktury geometrycznej powierzchni
Title (EN)
Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters

Step-by-step procedure

  1. Establishing requirements

    Read from the drawing or specification which parameters (e.g. Ra, Rz) and limits are to be checked and according to which standard they are defined (ISO 4287 or ISO 21920-2).

  2. Instrument set-up

    Choose the stylus and the λs and λc filters for the required parameter — the relationships are given in ISO 3274 and ISO 4288 (now ISO 21920-3); an example table: Mitutoyo guide.

  3. Profile recording

    Traverse the stylus over the surface along a specified line and record the primary profile (ISO 4287, 3.1.4–3.1.5).

  4. Filtering

    Obtain the roughness profile (λs and λc filters) or the waviness profile (λf and λc) according to ISO 11562 (3.1.6–3.1.7).

  5. Calculating parameters

    Calculate the parameters over sampling lengths or the evaluation length according to the definitions of the standard in which the requirement is given.

  6. Assessment and report

    Compare the results with the requirement according to the rules of ISO 4288 (now ISO 21920-3) and report the parameters, filters and the defining standard.

Required equipment and apparatus

EquipmentExampleIndicative price
Contact (stylus) instrumentnominal characteristics according to ISO 3274:1996 (normative reference of ISO 4287; ISO 3274 withdrawn on 14.02.2025)—
Phase-correct filtersλs, λc, λf according to ISO 11562 (3.1.1)—
Stylusconical tip with a spherical end of 2 µm, 5 µm or 10 µm radius (Mitutoyo guide)—

Reagents, media and consumables

ReagentCASDetails
Not applicable—the standard gives terms and parameters; no reagents are involved

Health and safety (OHS)

Frequently asked questions

Which standard describes this test?

The test is performed according to PN-EN ISO 4287:1999 — “Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters”.

How does this method work?

The stylus of a contact instrument traverses the surface along a specified line, and the recorded primary profile is filtered: the λs filter removes the shortest waves and the λc filter separates roughness from waviness. Parameters are determined from the roughness profile, for example Ra (arithmetic mean of the absolute ordinates) and Rz (sum of the highest peak and the deepest valley within a sampling length according to ISO 4287).

What is the measuring range and accuracy?

Ra: arithmetic mean of the absolute ordinate values of the roughness profile within a sampling length (ISO 4287; Mitutoyo guide); Rz: sum of the largest profile peak height and the largest profile valley depth within a sampling length (ISO 4287; Mitutoyo guide); Other parameters: Rq, Rp, Rv, Rt (within the evaluation length), RSm, as well as primary profile (P) and waviness (W) parameters; Profile filters: λs, λc, λf — characteristic according to ISO 11562, different cut-off wavelengths (3.1.1).

How long does the test take?

The procedure comprises 6 steps. The standard does not give a duration for every stage — the laboratory's own procedure decides.

What equipment is required?

Contact (stylus) instrument, Phase-correct filters, Stylus.

Where is this test used?

Specifying and reading requirements for roughness, waviness and primary profile on drawings and in product specifications — terms and parameters of the profile method (ISO 4287, clause 1); Assessment of roughness after machining and comparison with the drawing tolerance — according to the rules of ISO 4288, now ISO 21920-3; Transition of documentation and instrument software from ISO 4287 to ISO 21920-2 (change in the definition of field parameters).

What safety precautions apply?

The standard contains no safety requirements; the rules for working with the instrument and with heavy workpieces are set by the laboratory on the basis of a risk assessment.

Which laboratory can perform this test?

The test is performed by laboratories accredited to ISO/IEC 17025. On LabCoda you can find them by the standard number PN-EN ISO 4287.

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